JEOL SEM
JEOL 6480LA SEM – Tungsten Variable Pressure Scanning Electron Microscope
- Variable pressure SEM
- LV pressure -1 to 270 Pa
- Great for uncoated biological specimens.
- Both biological and material specimens
- Maximum resolution of 4nm
- Large depth of field
- Equipped with EX-94300 SDD Energy Dispersive X-ray analyser
- Equipped with Deben Coolstage