PHENOM XL

PHENOM XL

PHENOM XL Benchtop SEM

Phenom XL 

  • Multi-functional desktop Scanning Electron Microscope
  • High-throughput imaging on biological, material, devices and components.
  • High- throughput elemental analysis on biological, material, devices and components.
  • Electron magnification range: 80 – 100,000x
  • Resolution: ≤ 20nm
  • Acceleration voltages: 5kV, 10kV and 15kV
  • Vacuum modes: standard, charge reduction and high vacuum
  • Detectors: BSD (backscattered), SED (secondary) and EDS
  • Sample size: max. 100mm x 100mm. Up to 36 x 12mm pin stubs.
  • EDS mapping, spot and line analysis.
  • Real time in-situ tensile testing (MICROTEST module)
  • In-situ chemical probing/molecular imaging of a sample in liquid (Wet Cell II module)
  • Very easy to use.
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