JEOL JSM
JEOL JSM 7100F FESEM – Field Emission Scanning Electron Microscope
- Ideal for imaging of micro and nano structures.
- Both biological and material samples.
- Has a resolution (sample dependent) of 1.2nm at 30kV and 3.0nm at 1Kv
- Equipped with a Kleindiek MM3A-EM Micromanipulator for precision in-situ nanomanipulation.