Bruker Innova
Bruker Innova AFM - Atomic Force Microscope
- Innova SPM System
- Imaging with Contact and Tapping Mode and force spectroscopy
- Imaging with derived modes: Lateral Force Microscopy and Phase Imaging
- A high performance 5um x 5um closed loop scanner (2.5um Z range)
- NanoScope Analysis software, electronics controller and PC
- Liquid Imaging option