ACAC Seminar Abstract

ACAC Seminar Abstract

ACAC Seminars

ACAC Seminar Abstract

Coding for the Small

Speaker: Yeow Meng Chee
Date, Time: Wed, 18 Mar 2009 11:00

Reduction in the feature size of VLSI fabrication processes to nanometer-scale levels has led to new challenges in VLSI circuit design. The characteristics of on-chip wires have changed, with increased resistance and capacitance. This leads to power dissipation and crosstalk noise, among others. Design validation alone cannot solve these problems since some of these only surface post-fabrication. Active error-correction is required. This talk surveys new interesting reliability problems in submicron, deep submicron, and nanometer scale circuits.

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